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Influence of planar defects on powder diffractograms of fcc metals

Published online by Cambridge University Press:  06 March 2012

A. I. Ustinov  and
N. M. Budarina
A. I. Ustinov
Affiliation:
Institute for Metal Physics, Kyiv 03680, Ukraine
N. M. Budarina
Affiliation:
Institute for Metal Physics, Kyiv 03680, Ukraine
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Abstract

X-ray powder diffractograms from fcc crystals containing high concentration (more than 1%) of planar defects [deformation stacking faults (SF), double deformation SF, twin boundaries (TB)] have been simulated by Monte Carlo method in kinematic approach. It was shown that the characteristics of powder diffraction peak profiles (except peaks with indexes H00) dependent nonmonotonically on PD concentration, during which peak maximums stay in Bragg positions. An addition point to emphasize is that an appearance of TB only in the crystal not affects on position of all peaks. Several types of PD to be occurred simultaneously in the crystal influence on powder diffractograms additively. Peculiarities of the powder diffraction pattern inherent in different types of PD have been revealed to permit predominant PD type to be found with a high degree of accuracy based on experimental data.

Keywords

X-ray powder diffractionfcc crystalplanar defects

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Type
Technical Articles
Information
Powder Diffraction , Volume 17 , Issue 4 , December 2002 , pp. 270 - 277
Copyright
Copyright © Cambridge University Press 2002

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