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An empirical derivation of the X-ray optic transmission profile used in calibrating the Planetary Instrument for X-ray Lithochemistry (PIXL) for Mars 2020

Published online by Cambridge University Press:  24 May 2018

C. M. Heirwegh ,
W. T. Elam ,
D. T. Flannery  and
A. C. Allwood
C. M. Heirwegh*
Affiliation:
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California
W. T. Elam
Affiliation:
Applied Physics Laboratory, University of Washington, Seattle, Washington
D. T. Flannery
Affiliation:
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California
A. C. Allwood
Affiliation:
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California
*
a)Author to whom correspondence should be addressed. Electronic mail: christopher.m.heirwegh@jpl.nasa.gov
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Abstract

Calibration of the prototype Planetary Instrument for X-ray Lithochemistry (PIXL) selected for Mars 2020 has commenced with an empirical derivation of the X-ray optic transmission profile. Through a straightforward method of dividing a measured “blank” spectrum over one calculated assuming no optic influence, a rudimentary profile was formed. A simple boxcar-smoothing algorithm was implemented to approximate the complete profile that was incorporated into PIQUANT. Use of this form of smoothing differs from the more conventional approach of using a parameter-based function to complete the profile. Comparison of element-specific correction factors, taken from a measurement of NIST SRM 610, was used to assess the accuracy of the new profile. Improvement in the low- to mid-energy portion of the data was apparent though the high-energy region diverged from unity, and thus, requires further refinement.

Keywords

PIXLMARS 2020optic transmissionX-ray lithochemistryempirical derivation

Information

Type
Technical Article
Information
Powder Diffraction , Volume 33 , Issue 2 , June 2018 , pp. 162 - 165
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Copyright
Copyright © International Centre for Diffraction Data 2018 

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