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Movie-mode dynamic electron microscopy

Published online by Cambridge University Press:  13 January 2015

Thomas LaGrange ,
Bryan W. Reed  and
Daniel J. Masiel
Thomas LaGrange
Affiliation:
Integrated Dynamic Electron Solutions, CA, USA; lagrange@phaseplate.com.
Bryan W. Reed
Affiliation:
Integrated Dynamic Electron Solutions, CA, USA; bryan@phaseplate.com
Daniel J. Masiel
Affiliation:
Integrated Dynamic Electron Solutions, CA, USA; dan@phaseplate.com
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Abstract

The need to understand fast, complex physical phenomena through direct insitu observation has spurred the development ofhigh-time-resolution transmission electron microscopy (TEM). Two complementaryapproaches have emerged: the single-shot and stroboscopic techniques.Single-shot TEM has advanced through the development of dynamic transmissionelectron microscopy (DTEM) and, more recently, by the advent of movie-mode DTEM,which enables high-frame-rate in situ TEM experimentation bycapturing nanosecond-scale sequences of images or diffraction patterns. PreviousDTEM studies produced only single snapshots of fast material processes.Movie-mode DTEM provides the ability to track the creation, motion, andinteraction of individual defects, phase fronts, and chemical reaction fronts,providing invaluable information on the chemical, microstructural, andatomic-level features that govern rapid material processes. This articlediscusses movie-mode DTEM technology, its application in the study of reactiondynamics in Ti–B-based reactive nanolaminates, and futureinstrumentation.

Keywords

Transmission electron microscopy (TEM)microstructurekineticsnucleation & growthphase transformation

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Type
Research Article
Information
MRS Bulletin , Volume 40 , Issue 1: Frontiers of in situ electron microscopy , January 2015 , pp. 22 - 28
Copyright
Copyright © Materials Research Society 2015 

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References

Porter, D.A., Easterling, K.E., Phase Transformations in Metals and Alloys, (Nelson Thrones Ltd., Delta Place, UK, 2nd ed. 1992).CrossRefGoogle Scholar
Spivak, G.V., Pavlyuchenko, O.P., Petrov, V.I., Bull. Acad. Sci. USSR Phys. Ser. 30, 822 (1966).Google Scholar
Bostanjoglo, O., Adv. Imaging Electron Phys. 121, 1 (2002).CrossRefGoogle Scholar
Bostanjoglo, O., Elschner, R., Mao, Z., Nink, T., Weingartner, M., Ultramicroscopy 81, 141 (2000).CrossRefGoogle Scholar
Bostanjoglo, O., Tornow, R.P., Tornow, W., J. Phys. E: Sci. Instrum. 20, 556 (1987).CrossRefGoogle Scholar
Domer, H., Bostanjoglo, O., Rev. Sci. Instrum. 74, 4369 (2003).CrossRefGoogle Scholar
Barwick, B., Park, H.S., Kwon, O.H., Baskin, J.S., Zewail, A.H., Science 322, 1227 (2008).CrossRefGoogle Scholar
Zewail, A.H., Philos. Trans. R. Soc. Lond. A 363, 315 (2005).Google Scholar
Zewail, A.H., Science 328, 187 (2010).CrossRefGoogle Scholar
Armstrong, M.R., Boyden, K., Browning, N.D., Campbell, G.H., Colvin, J.D., DeHope, W.J., Frank, A.M., Gibson, D.J., Hartemann, F., Kim, J.S., King, W.E., LaGrange, T.B., Pyke, B.J., Reed, B.W., Shuttlesworth, R.M., Stuart, B.C., Torralva, B.R., Ultramicroscopy 107, 356 (2007).CrossRefGoogle Scholar
Armstrong, M.R., Reed, B.W., Torralva, B.R., Browning, N.D., Appl. Phys. Lett. 90, 114101 (2007).CrossRefGoogle Scholar
LaGrange, T., Armstrong, M.R., Boyden, K., Brown, C.G., Campbell, G.H., Colvin, J.D., DeHope, W.J., Frank, A.M., Gibson, D.J., Hartemann, F.V., Kim, J.S., King, W.E., Pyke, B.J., Reed, B.W., Shirk, M.D., Shuttlesworth, R.M., Stuart, B.C., Torralva, B.R., Browning, N.D., Appl. Phys. Lett. 89, 044105 (2006).CrossRefGoogle Scholar
LaGrange, T., Campbell, G.H., Reed, B., Taheri, M., Pesavento, J.B., Kim, J.S., Browning, N.D., Ultramicroscopy 108, 1441 (2008).CrossRefGoogle Scholar
LaGrange, T., Reed, B.W., Santala, M.K., McKeown, J.T., Kulovits, A., Wiezorek, J.M., Nikolova, L., Rosei, F., Siwick, B.J., Campbell, G.H., Micron 43, 1108 (2012).CrossRefGoogle Scholar
Reed, B.W., Armstrong, M.R., Browning, N.D., Campbell, G.H., Evans, J.E., LaGrange, T., Masiel, D.J., Microsc. Microanal. 15, 272 (2009).CrossRefGoogle Scholar
Campbell, G.H., LaGrange, T., Kim, J.S., Reed, B.W., Browning, N.D., J. Electron Microsc. 59, S67 (2010).CrossRefGoogle Scholar
Kim, J.S., LaGrange, T., Reed, B.W., Knepper, R., Weihs, T.P., Browning, N.D., Campbell, G.H., Acta Mater. 59, 3571 (2011).CrossRefGoogle Scholar
Kim, J.S., LaGrange, T., Reed, B.W., Taheri, M.L., Armstrong, M.R., King, W.E., Browning, N.D., Campbell, G.H., Science 321, 1472 (2008).CrossRefGoogle Scholar
LaGrange, T., Campbell, G.H., Turchi, P.E.A., King, W.E., Acta Mater. 55, 5211 (2007).CrossRefGoogle Scholar
LaGrange, T., Grummon, D.S., Reed, B.W., Browning, N.D., King, W.E., Campbell, G.H., Appl. Phys. Lett. 94, 184101 (2009).CrossRefGoogle Scholar
McKeown, J.T., Kulovits, A.K., Liu, C., Zweiacker, Kai, Reed, B.W., LaGrange, T., Wiezorek, J.M.K., Campbell, G.H., Acta Mater. 65, 56 (2014).CrossRefGoogle Scholar
Nikolova, L., LaGrange, T., Reed, B.W., Stern, M.J., Browning, N.D., Campbell, G.H., Kieffer, J.C., Siwick, B.J., Rosei, F., Appl. Phys. Lett. 97, 3 (2010).CrossRefGoogle Scholar
Taheri, M.L., LaGrange, T., Reed, B.W., Armstrong, M.R., Campbell, G.H., DeHope, W.J., Kim, J.S., King, W.E., Masiel, D.J., Browning, N.D., Microsc. Res. Tech. 72, 122 (2009).CrossRefGoogle Scholar
Lobastov, V.A., Srinivasan, R., Zewail, A.H., Proc. Natl. Acad. Sci. U.S.A. 102, 7069 (2005).CrossRefGoogle Scholar
Barwick, B., Flannigan, D.J., Zewail, A.H., Nature 462, 902 (2009).CrossRefGoogle Scholar
Carbone, F., Barwick, B., Kwon, O.H., Park, H.S., Baskin, J.S., Zewail, A.H., Chem. Phys. Lett. 468, 107 (2009).CrossRefGoogle Scholar
Carbone, F., Kwon, O.H., Zewail, A.H., Science 325, 181 (2009).CrossRefGoogle Scholar
Flannigan, D.J., Barwick, B., Zewail, A.H., Proc. Natl. Acad. Sci. U.S.A. 107, 9933 (2010).CrossRefGoogle Scholar
Flannigan, D.J., Samartzis, P.C., Yurtsever, A., Zewail, A.H., Nano Lett. 9, 875 (2009).CrossRefGoogle Scholar
Kwon, O.H., Barwick, B., Park, H.S., Baskin, J.S., Zewail, A.H., Nano Lett. 8, 3557 (2008).CrossRefGoogle Scholar
Kwon, O.H., Barwick, B., Park, H.S., Baskin, J.S., Zewail, A.H., Proc. Natl. Acad. Sci. U.S.A. 105, 8519 (2008).CrossRefGoogle Scholar
Reed, B.W., LaGrange, T., Shuttlesworth, R.M., Gibson, D.J., Campbell, G.H., Browning, N.D., Rev. Sci. Instrum. 81, 053706 (2010).CrossRefGoogle Scholar
Krüger, M., Schenk, M., Hommelhoff, P., Nature 475, 78 (2011).CrossRefGoogle Scholar
King, W.E., Campbell, G.H., Frank, A., Reed, B., Schmerge, J.F., Siwick, B.J., Stuart, B.C., Weber, P.M., J. Appl. Phys. 97, 111101 (2005).CrossRefGoogle Scholar
Bostanjoglo, O., Rosin, T., Mikroskopie 32, 190 (1976).Google Scholar
Bostanjoglo, O., Rosin, T., Proc. 7th Eur. Congr. Electron Microscopy, Brederoo, P., Boom, G., Eds. (Seventh European Congress on Electron Microscopy Foundation, The Hague, The Netherlands, 1980), p. 88.Google Scholar
Takaoka, A., Ura, K., J. Electron Microsc. 37, 117 (1988).Google Scholar
Santala, M.K., Reed, B.W., Raoux, S., Topuria, T., LaGrange, T., Campbell, G.H., Appl. Phys. Lett. 102, 174105 (2013).CrossRefGoogle Scholar
LaGrange, T., Reed, B.W., McKeown, J.T., Santala, M.J., Dehope, W.J., Huete, G., Shuttlesworth, R.M., Campbell, G.H., Microsc. Microanal. 19, 1154 (2013).CrossRefGoogle Scholar
Li, H.P., Acta Mater. 51, 3213 (2003).CrossRefGoogle Scholar
Avrami, M., J. Chem. Phys. 7, 1103 (1939).CrossRefGoogle Scholar
Johnson, W.A., Mehl, R.F., Trans. Am. Inst. Min. Metall. Eng. 135, 416 (1939).Google Scholar
Azatyan, T.S., Maltsev, V.M., Merzhanov, A.G., Seleznev, V.A., Combust. Explos. Shock Waves 16, 163 (1980).CrossRefGoogle Scholar
Holt, J.B., Kingman, D.D., Bianchini, G.M., Mater. Sci. Eng. 71, 321 (1985).CrossRefGoogle Scholar
Claessens, B.J., van der Geer, S.B., Taban, G., Vredenbregt, E.J.D., Luiten, O.J., Phys. Rev. Lett. 95, 164801 (2005).CrossRefGoogle Scholar
McCulloch, A.J., Sheludko, D.V., Saliba, S.D., Bell, S.C., Junker, M., Nugent, K.A., Scholten, R.E., Nat. Phys. 7, 785 (2011).CrossRefGoogle Scholar