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Line X-ray emission from Al targets irradiated by high-intensity, variable-length laser pulses

Published online by Cambridge University Press:  05 August 2002

J. LIMPOUCH ,
O. RENNER ,
E. KROUSKÝ ,
I. USCHMANN ,
E. FÖRSTER ,
M.P. KALASHNIKOV  and
P.V. NICKLES
J. LIMPOUCH
Affiliation:
Czech Technical University in Prague, Faculty of Nuclear Sciences and Physical Engineering, Brehová 7, 115 19 Prague, Czech Republic
O. RENNER
Affiliation:
Institute of Physics, Academy of Sciences CR, Na Slovance 2, 182 21 Prague, Czech Republic
E. KROUSKÝ
Affiliation:
Institute of Physics, Academy of Sciences CR, Na Slovance 2, 182 21 Prague, Czech Republic
I. USCHMANN
Affiliation:
Institut für Optik und Quantenelektronik, Friedrich-Schiller-Universität, Max-Wien-Platz 1, 07743 Jena, Germany
E. FÖRSTER
Affiliation:
Institut für Optik und Quantenelektronik, Friedrich-Schiller-Universität, Max-Wien-Platz 1, 07743 Jena, Germany
M.P. KALASHNIKOV
Affiliation:
Max-Born-Institut, Rudower Chaussee 4, 12489 Berlin, Germany
P.V. NICKLES
Affiliation:
Max-Born-Institut, Rudower Chaussee 4, 12489 Berlin, Germany
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Abstract

The absolutely calibrated K-shell spectra emitted from short-living aluminum plasmas at laser intensities of 5 × 1015–4 × 1018 W/cm2 are reported. The experiments performed with the constant energy, variable-length laser pulses (1.5 ps–1 ns) are modeled by the one-dimensional (1D) hydrodynamics code, including nonlinear resonance absorption of the laser radiation, fast electron acceleration, and energy transfer into the target. The characteristic features of the measured and the postprocessed spectra are outlined. The spatial and temporal profiles of the emitted spectra are presented; the scaling rules for the conversion efficiency of the laser radiation into the line X-ray emission are discussed.

Keywords

Laser-produced plasmaLine X-ray emissionX-ray sourcesX-ray spectroscopy

Information

Type
Research Article
Information
Laser and Particle Beams , Volume 20 , Issue 1 , January 2002 , pp. 43 - 49
Copyright
© 2002 Cambridge University Press

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