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Mechanical and tribological properties of AlCuFe quasicrystal and Al(Si)CuFe approximant thin films

Published online by Cambridge University Press:  28 December 2015

Simon Olsson ,
Esteban Broitman Open the ORCID record for Esteban Broitman [Opens in a new window] ,
Magnus Garbrecht Open the ORCID record for Magnus Garbrecht [Opens in a new window] ,
Jens Birch Open the ORCID record for Jens Birch [Opens in a new window] ,
Lars Hultman Open the ORCID record for Lars Hultman [Opens in a new window]  and
Fredrik Eriksson
Simon Olsson
Affiliation:
Thin Film Physics Division, IFM, Linköping University, SE-581 83 Linköping, Sweden
Esteban Broitman
Affiliation:
Thin Film Physics Division, IFM, Linköping University, SE-581 83 Linköping, Sweden
Magnus Garbrecht
Affiliation:
Thin Film Physics Division, IFM, Linköping University, SE-581 83 Linköping, Sweden
Jens Birch
Affiliation:
Thin Film Physics Division, IFM, Linköping University, SE-581 83 Linköping, Sweden
Lars Hultman
Affiliation:
Thin Film Physics Division, IFM, Linköping University, SE-581 83 Linköping, Sweden
Fredrik Eriksson*
Affiliation:
Thin Film Physics Division, IFM, Linköping University, SE-581 83 Linköping, Sweden
*
a) Address all correspondence to this author. e-mail: freer@ifm.liu.se
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Abstract

Multilayered thin films of Al/Cu/Fe have been prepared by magnetron sputtering and annealed into quasicrystalline and approximant phases on Al2O3 and Si substrates, respectively. The nanomechanical and nanotribological properties, such as hardness, elastic modulus, friction, and toughness, have been measured using a triboindenter and analytical methods. The approximant phase was proved to be slightly harder than the quasicrystalline phase with a hardness of about 15.6 GPa, and with a similar elastic modulus of about 258 GPa. These values however decreased rapidly with an increasing amount of Si in the approximant. The indentation toughness of the approximant, <0.1 MPa/m½, was however inferior to that of the quasicrystals with 1.5 MPa/m½. Friction coefficients were measured in a range of 0.10–0.14 for both the quasicrystalline and approximant thin films.

Keywords

quasicrystalapproximantthin filmhardnesselastic modulusfrictiontoughnesstribologyTEMSTEMXRD

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Type
Articles
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Journal of Materials Research , Volume 31 , Issue 2 , 28 January 2016 , pp. 232 - 240
Copyright
Copyright © Materials Research Society 2015 

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